Sec S3c2443x Test B D Driver Apr 2026

| Parameter | Meaning | |-----------|---------| | mode | 0 = buffer‑overflow test, 1 = timing jitter, 2 = fault‑injection | | iterations | Number of stress cycles (max 10 000) | | seed | Pseudo‑random seed for pattern generation |

err_unregister: unregister_chrdev_region(dev_num, 1); return ret; Sec S3c2443x Test B D Driver

struct resource *res; int ret;

device_create(class, NULL, dev_num, NULL, "sec_testbd"); return 0; | Parameter | Meaning | |-----------|---------| | mode

# Verify device node ls -l /dev/sec_testbd # → crw-rw---- 1 root video 250, 0 Mar 23 12:34 /dev/sec_testbd 1 = timing jitter

/* 1. Acquire memory region */ res = platform_get_resource(pdev, IORESOURCE_MEM, 0); testbd->base = devm_ioremap_resource(&pdev->dev, res); if (IS_ERR(testbd->base)) return PTR_ERR(testbd->base);